Specific Process Knowledge/Lithography/EBeamLithography/FirstEBL: Difference between revisions
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The pattern used in this example is very small and centred around (0,0). The example above will create a 3x3 matrix of height data with a pitch of 1 mm in x and y. After execution the system will display a matrix with height measurement data in µm. Verify that there are no outliers and that variation is less than 100 µm. | The pattern used in this example is very small and centred around (0,0). The example above will create a 3x3 matrix of height data with a pitch of 1 mm in x and y. After execution the system will display a matrix with height measurement data in µm. Verify that there are no outliers and that variation is less than 100 µm. | ||
==Save condition file== | |||
For the calibration data to have effect during exposure the data must be saved into the calibration profile. This is done via the '''SAVE''' subprogram from the '''Calibration''' window. | |||
*Select the '''SAVE''' subprogram | |||
*Click '''Edit Parameter...''' | |||
*From the '''SAVE''' window click '''Acquisition of latest status''' | |||
*Wait 5 seconds for the window to populate with data | |||
*Click '''Apply''' and '''Save''' | |||
{| style="border: none; border-spacing: 0; margin: 1em auto; text-align: center;" | |||
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| [[image:9500save1.png|600px]] | |||
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Acquire the calibration data and then apply the data to save. Image: Thomas Pedersen. | |||
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Alle of the calibration data is now saved and the system is ready for exposure. | |||
=Development= | =Development= | ||