Specific Process Knowledge/Characterization/XRD/Process Info: Difference between revisions
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= Process information = | = Process information = | ||
The following measurements types are just some of the options you have on the [http://labadviser.nanolab.dtu.dk/index.php?title=Specific_Process_Knowledge/Characterization/XRD/XRD_SmartLab Rigaku SmartLab] | The following measurements types are just some of the options you have on the [http://labadviser.nanolab.dtu.dk/index.php?title=Specific_Process_Knowledge/Characterization/XRD/XRD_SmartLab Rigaku SmartLab] | ||
== Slit selection (BB vs. PB)== | |||
<gallery caption="XPS recordings. 10 nm SiC deposited on Si wafer" widths="500px" heights="480px" perrow="2"> | |||
image:eves_BB_slit_selection_20230206.png|<b>C 1s</b> signal. | |||
image:eves_PB_slit_selection_20230206.png|<b>C 1s</b> signal. | |||
</gallery> | |||
= Bragg-Brentano= | |||
<gallery caption="XPS recordings. 10 nm SiC deposited on Si wafer" widths="700px" heights="480px" perrow="1"> | |||
image:eves_Bragg_Brentano_concept_20230206.png|<b>C 1s</b> signal. | |||
</gallery> | |||
= Parallel beam= | |||
==Types of scans in the reciprocal space== | ==Types of scans in the reciprocal space== | ||