Specific Process Knowledge/Characterization/XRD/Process Info: Difference between revisions
| Line 45: | Line 45: | ||
==High Resolution XRD (HRXRD)== | ==High Resolution XRD (HRXRD)== | ||
<gallery caption="XPS recordings. 10 nm SiC deposited on Si wafer" widths="700px" heights=" | <gallery caption="XPS recordings. 10 nm SiC deposited on Si wafer" widths="700px" heights="480px" perrow="2"> | ||
image:eves_XRD_drawing_series_HRXRD1_20230206.png|<b>C 1s</b> signal. | image:eves_XRD_drawing_series_HRXRD1_20230206.png|<b>C 1s</b> signal. | ||
image:eves_XRD_drawing_series_HRXRD2_20230206.png|<b>C 1s</b> signal. | image:eves_XRD_drawing_series_HRXRD2_20230206.png|<b>C 1s</b> signal. | ||