Specific Process Knowledge/Characterization/XRD/Process Info: Difference between revisions
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[[File:RC.png|400px]] | [[File:RC.png|400px]] | ||
==High Resolution XRD (HRXRD)== | |||
<gallery caption="XPS recordings. 10 nm SiC deposited on Si wafer" widths="700px" heights="550px" perrow="2"> | |||
image:eves_XRD_drawing_series_HRXRD1_20230206.png|<b>C 1s</b> signal. | |||
image:eves_XRD_drawing_series_HRXRD2_20230206.png|<b>C 1s</b> signal. | |||
</gallery> | |||
==2θ scan. Graizing Incident X-ray Diffraction (GiXRD)== | ==2θ scan. Graizing Incident X-ray Diffraction (GiXRD)== | ||