Specific Process Knowledge/Characterization/XRD/Process Info: Difference between revisions
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==Rocking courve (ω scan)== | ==Rocking courve (ω scan)== | ||
<gallery caption="XPS recordings. 10 nm SiC deposited on Si wafer" widths=" | <gallery caption="XPS recordings. 10 nm SiC deposited on Si wafer" widths="700px" heights="550px" perrow="2"> | ||
image:eves_XRD_drawing_series_RC1_20230206.png|<b>C 1s</b> signal. | image:eves_XRD_drawing_series_RC1_20230206.png|<b>C 1s</b> signal. | ||
image:eves_XRD_drawing_series_RC2_20230206.png|<b>C 1s</b> signal. | image:eves_XRD_drawing_series_RC2_20230206.png|<b>C 1s</b> signal. | ||
</gallery> | </gallery> | ||
<gallery caption="XPS recordings. 10 nm SiC deposited on Si wafer" widths=" | <gallery caption="XPS recordings. 10 nm SiC deposited on Si wafer" widths="700px" heights="300px" perrow="1"> | ||
image:eves_omega_scan_concept_20230131.png|<b>C 1s</b> signal. | image:eves_omega_scan_concept_20230131.png|<b>C 1s</b> signal. | ||
</gallery> | </gallery> | ||