Specific Process Knowledge/Characterization/XRD/Process Info: Difference between revisions
| Line 42: | Line 42: | ||
==2θ scan. Graizing Incident X-ray Diffraction(GiXRD)== | ==2θ scan. Graizing Incident X-ray Diffraction(GiXRD)== | ||
<gallery caption="XPS recordings. 10 nm SiC deposited on Si wafer" widths="300px" heights="250px" perrow="1"> | |||
image:eves_2theta_scan_concept_20230131.png|<b>C 1s</b> signal. | |||
</gallery> | |||
==Pole figure== | ==Pole figure== | ||