Specific Process Knowledge/Characterization/XPS/NexsaOverview: Difference between revisions
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|LMdocAuthor=S McDonnell | |LMdocAuthor=S McDonnell | ||
|docLink=https://doi.org/10.1016/j.apsusc.2018.04.127 | |docLink=https://doi.org/10.1016/j.apsusc.2018.04.127 | ||
|XPSused= |UPSused= |ISSused= |REELSused= |Ramanused= | |XPSused= |UPSused= |ISSused=x |REELSused= |Ramanused= | ||
|AdditionalOption=AFM, ALD | |AdditionalOption=AFM, ALD | ||
|Sample=HfO2, MoS2 | |Sample=HfO2, MoS2 | ||