Specific Process Knowledge/Lithography/Pretreatment: Difference between revisions
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'''Contact angle:''' | |||
The contact angle of the substrate surface can be measured using the [[Specific_Process_Knowledge/Characterization/Drop_Shape_Analyzer|Drop Shape Analyzer]]. | The contact angle of the substrate surface can be measured using the [[Specific_Process_Knowledge/Characterization/Drop_Shape_Analyzer|Drop Shape Analyzer]]. | ||