Specific Process Knowledge/Characterization/XRD/XRD Powder/Measurement tips: Difference between revisions
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==Choosing measurement parameters== | ==Choosing measurement parameters== | ||
A detailed manual on the Aeris XRD is found on the [https://wiki.iodp.tamu.edu/display/LMUG/Aeris+Advanced+User+Guide wiki of the International Ocean Discovery Project]. | A detailed manual on the Aeris XRD is found on the [https://wiki.iodp.tamu.edu/display/LMUG/Aeris+Advanced+User+Guide wiki of the International Ocean Discovery Project]. It has helpful hints on adjusting the hardware including choices on beam knife height and slit size. It also has some pictures from the XRDMP Creator software. Some info from there: | ||
...Scanning at angles less than 5° 2θ you will need to lower the knife (anti scatter). | ...Scanning at angles less than 5° 2θ you will need to lower the knife (anti scatter). | ||
.... at low angles you also need a narrower slit (which will reduce intensity but also the irradiated area) | .... at low angles you also need a narrower slit (which will reduce intensity but also the irradiated area) | ||