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Specific Process Knowledge/Lithography/Aligners/Aligner: Maskless 03 processing: Difference between revisions

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In the fast mode, each area of the pattern is exposed by 2 stripes only. This reduces the exposure time by 60%, but also increases the size of the address grid in the X-direction to 250nm. This means that alignment will be less accurate in fast mode. Due to less averaging of non-uniformities, stitching effects will be more prominent in this mode.
In the fast mode, each area of the pattern is exposed by 2 stripes only. This reduces the exposure time by 60%, but also increases the size of the address grid in the X-direction to 250nm. This means that alignment will be less accurate in fast mode. Due to less averaging of non-uniformities, stitching effects will be more prominent in this mode.
'''Data represent dose-defocus tests on Si unless otherwise stated'''
{|border="1" cellspacing="1" cellpadding="7" style="text-align:left;"
|-
|-
|-style="background:silver; color:black"
|
!Thickness
!Exposure mode
!Dose
!Defoc
!Resolution
!Comments
|-
|-
|-style="background:WhiteSmoke; color:black"
!rowspan="2"| AZ 5214E
|rowspan="2"| 1.5 µm
| Fast
| 70 mJ/cm<sup>2</sup>  (Jehem Oct 2020)
| 0 (Jehem Oct 2020)
| 2 µm (due to stitching)
| Dev: SP60s
|-style="background:WhiteSmoke; color:black"
| Quality
| 70 mJ/cm<sup>2</sup> (Jehem Oct 2020)
| 0 (Jehem Oct 2020)
| 1.25 µm
| Dev: SP60s
|-
|-
|-style="background:WhiteSmoke; color:black"
!rowspan="2"| AZ MiR 701
|rowspan="2"| 1.5 µm
| Fast
| 300 mJ/cm<sup>2</sup>  (Jehem Feb 2020)
| 0 (Jehem Feb 2020)
| 2 µm (due to stitching)
| PEB: 60s@110°C, Dev: SP60s
|-style="background:WhiteSmoke; color:black"
| Quality
| 180-200 mJ/cm<sup>2</sup> (Taran Mar 2020)
| 0-1 (Jehem Mar 2020)
| 1 µm
| PEB: 60s@110°C, Dev: SP60s
|-
|-
|-style="background:WhiteSmoke; color:black"
!rowspan="2"| AZ 5214E image reversal
|rowspan="2"| 2.2 µm
| Fast
| 43 mJ/cm<sup>2</sup> (Taran Mar 2020)
| 0 (Jehem Feb 2020)
| >2 µm (a lot of stitching)
| Reversal bake: 120s@110°C, Flood exposure: 200mJ/cm<sup>2</sup>, Dev: SP60s
|-style="background:WhiteSmoke; color:black"
| Quality
| 43 mJ/cm<sup>2</sup> (Taran Mar 2020)
| 0 (Jehem Feb 2020)
| 2 µm (due to stitching)
| Reversal bake: 120s@110°C, Flood exposure: 200mJ/cm<sup>2</sup>, Dev: SP60s
|-
|}
'''AZ nLOF 2020''' has also been tested. It seems to work even at 405nm, but the dose is so high (>10000) that exposure would be slower than Aligner: Maskless 02.


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