Specific Process Knowledge/Lithography/ARN8200: Difference between revisions
Appearance
| Line 7: | Line 7: | ||
== Contrast curve == | == Contrast curve == | ||
Exposure dose for AR-N 8200 is very dependent on Post Exposure Bake (PEB) temperature. A contrast curve for four different PEB processes were obtained | Exposure dose for AR-N 8200 is very dependent on Post Exposure Bake (PEB) temperature. A contrast curve for four different PEB processes were obtained with the following process parameters. | ||
{|border="1" cellspacing="0" cellpadding="3" style="text-align:left;" style="width: 95%" | {|border="1" cellspacing="0" cellpadding="3" style="text-align:left;" style="width: 95%" | ||