Specific Process Knowledge/Lithography/EBeamLithography: Difference between revisions
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|[[media:Process Flow HSQ.docx|process flow HSQ]] | |[[media:Process Flow HSQ.docx|process flow HSQ]] | ||
[[/High resolution patterning with HSQ|High resolution patterning with HSQ]] | [[/High resolution patterning with HSQ|High resolution patterning with HSQ]] | ||
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|'''AR-N 8200''' | |||
|Negative | |||
|[http://www.allresist.com AllResist] | |||
|Both e-beam and DUV sensitive resist. Currently being tested, contact [mailto:thope@dtu.dk Thomas Pedersen] for information. | |||
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|AR 300-47 | |||
|H2O | |||
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