LabAdviser/314/Microscopy 314-307/SEM/QFEG: Difference between revisions
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STEM combines the principles of transmission electron microscopy and scanning electron microscopy and can be performed on either type of instrument. In the STEM setting, the sample requires to have a thickness of less than 200 nm for visualization. | STEM combines the principles of transmission electron microscopy and scanning electron microscopy and can be performed on either type of instrument. In the STEM setting, the sample requires to have a thickness of less than 200 nm for visualization. | ||
[[File:20210519_Microalgae_K2_007-1.jpg|500px|left|thumb|STEM imaging of a 100 nm thick section | [[File:20210519_Microalgae_K2_007-1.jpg|500px|left|thumb|STEM imaging of a cross section of Microalgae, 100 nm thick section]]<br clear="all" /> | ||
[[File:20210413_Yeast_S1_005-1.jpg|500px|left|thumb|STEM imaging of a cross section of Yeast]]<br clear="all" /> | [[File:20210413_Yeast_S1_005-1.jpg|500px|left|thumb|STEM imaging of a cross section of Yeast, 100 nm thick section]]<br clear="all" /> | ||
== ESEM (Environmental Scanning Electron Microscopy) == | == ESEM (Environmental Scanning Electron Microscopy) == | ||