Specific Process Knowledge/Lithography/Descum: Difference between revisions
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===[http://labadviser.nanolab.dtu.dk/index.php/Specific_Process_Knowledge/Lithography/Strip#Plasma_asher Plasma asher 1]=== | ===[http://labadviser.nanolab.dtu.dk/index.php/Specific_Process_Knowledge/Lithography/Strip#Plasma_asher Plasma asher 1]=== | ||
[[image:Descum Results aug 2019.png|right|frame|400x400px| Descum results plasma asher 1]] | [[image:Descum Results aug 2019.png|right|frame|400x400px| Descum results plasma asher 1. September 2019]] | ||
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Conny Hjort & Jesper Hanberg | Conny Hjort & Jesper Hanberg | ||
September 2019 | September 2019 | ||
[[image:PA1_descum.jpg|right|frame|400x400px| Different resist descum results plasma asher 1. August 2021]] | |||
Descum of different resists, AZ5214E, AZ701 MiR and AZ2020 nLOF, on a single 100mm wafer was tested. Wafer was placed vertically in the middle of glass carrier. | Descum of different resists, AZ5214E, AZ701 MiR and AZ2020 nLOF, on a single 100mm wafer was tested. Wafer was placed vertically in the middle of glass carrier. |
Revision as of 10:39, 1 September 2021
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Descum results
Plasma asher 1
Descum of AZ5214E resist on 50mm silicon wafer. Wafer was placed horisontally in chamber on a 100 mm carier wafer.
Note: Plasma asher was cold before use
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Conny Hjort & Jesper Hanberg September 2019
Descum of different resists, AZ5214E, AZ701 MiR and AZ2020 nLOF, on a single 100mm wafer was tested. Wafer was placed vertically in the middle of glass carrier.
Recipe setting was the same as in previous test in September 2019: 70ml/min O2, 70 ml/min N2, power 150W, different ashing time 1, 2, 3, 5 and 7 min run. Plasma Asher was cold before use, we observed minor temperature rise during processing, but not more than 5 degrees. Starting chambers pressure was around 0, 5 mbar.
1,5 um AZ5214E resist
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1,5 um AZ5214E resist placed horizontally in the carrier
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1,5 um AZ701MiR resist
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1,5 um AZ 2020nLOF resist
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Plasma asher 2
Descum of AZ Mir 701 resist on 100mm silicon wafer. Five wafers were placed vertically in chamber.
Experiment parameters:
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recipe 1
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recipe 2
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We can observe linear dependance of etched material on time after etching 7 minutes and more (recipe 2).
Jitka Urbánková & Jesper Hanberg
December 2019