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Specific Process Knowledge/Etch/OES: Difference between revisions

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'''Example: The etching of silicon by fluorine:'''<br>
'''Example: The etching of silicon by fluorine:'''<br>
The table below contains the most important emission lines for some of the species in dry etching.
{| border="2" cellspacing="1" cellpadding="1"
| align="center" style="background:#f0f0f0;"|'''Monitored species'''
| align="center" style="background:#f0f0f0;" width="120px"|'''Wavelength (nm)'''
|
| align="center" style="background:#f0f0f0;"|'''Monitored species'''
| align="center" style="background:#f0f0f0;" width="120px"|'''Wavelength (nm)'''
|-
| Al||308.2, 309.3, 396.1
|rowspan="11"|
| In||325.6
|-
| AlCl||261.4 || N||674.0
|-
| As||235.0 ||  N<sub>2</sub>||315.9, 337.1
|-
| C<sub>2</sub>||516.5 ||  NO||247.9, 288.5, 289.3, 303.5, 304.3, 319.8, 320.7, 337.7, 338.6
|-
| CF<sub>2</sub>||251.9 ||  O||777.2, 844.7
|-
| Cl||741.4 ||  OH||281.1, 306.4, 308.9
|-
| CN||289.8, 304.2, 387.0 ||  S||469.5
|-
| CO||292.5, 302.8, 313.8, 325.3, 482.5, 483.5, 519.8 ||  Si||288.2
|-
| F||703.7, 712.8 ||  SiCl||287.1
|-
| Ga||417.2 || SiF||440.1, 777.0
|-
| H||486.1, 656.5 || ||
|-
|}