Specific Process Knowledge/Characterization/XPS/Nexsa: Difference between revisions
| Line 27: | Line 27: | ||
'''Check out the alternative techniques!''' | '''Check out the alternative techniques!''' | ||
It is clearly in everybody's interest that the techniques are explored - that we throw all kinds of samples at them and that we investigate what kind of knowledge we can extract. Ideally, all this knowledge that we | It is clearly in everybody's interest that the techniques are explored - that we throw all kinds of samples at them and that we investigate what kind of knowledge we can extract. Ideally, all this knowledge that we acquire should be shared among all the users. We therefore strongly urge you to take a look at the techniques on the pages listed below. Here, we will collect technical information and publications so that, hopefully, you will get inspired to explore the techniques with all kinds of samples. | ||
*[https://xpssimplified.com/whatisxps.php XPSsimplified - The Thermofisher web page on all the Nexsa techniques] | *[https://xpssimplified.com/whatisxps.php XPSsimplified - The Thermofisher web page on all the Nexsa techniques] | ||
| Line 35: | Line 35: | ||
*[[Specific Process Knowledge/Characterization/XPS/Raman|Raman spectroscopy]] | *[[Specific Process Knowledge/Characterization/XPS/Raman|Raman spectroscopy]] | ||
*[[Specific Process Knowledge/Characterization/XPS/UPS technique|Ultraviolet Photoelectron Spectroscopy or UPS]] | *[[Specific Process Knowledge/Characterization/XPS/UPS technique|Ultraviolet Photoelectron Spectroscopy or UPS]] | ||
'''Specific measurements''' | |||
The Nexsa is capable of measuring a lot of | |||
; Work function measurements | |||
: Based on the measurements of the Fermi Level and the spectrum energy cut-off in a UPS spectrum, the work function may be measured. The Nexsa manual section 3.6.x has more information. | |||
; Band gap measurements | |||
: | |||
; Mapping electronic bands using Angle resolved XPS (ARXPS) and UPS (ARUPS) | |||
: The Nexsa is capable of measuring the following | |||
*[[Specific Process Knowledge/Characterization/XPS/NexsaOverview|Table with a set of publications in which multiple techniques are used]] | *[[Specific Process Knowledge/Characterization/XPS/NexsaOverview|Table with a set of publications in which multiple techniques are used]] | ||
Revision as of 10:26, 20 November 2020
Feedback to this page: click here
The XPS Nexsa
Name: XPS Nexsa
Vendor: Thermofisher Scientific
The XPS Nexsa offers a variety of surface analysis techniques in addition to its main XPS technique.
The user manual(s), user APV(s), technical information and contact information are be found in LabManager:
Process information
The XPS Nexsa with all but one options
XPS is a well established technique at DTU Nanolab; we know what we can get from it and so do the users. Take a look at the page of the XPS K-Alpha to find more information. The situation is slightly different with the other analytical techniques that the Nexsa offers. These options were not added because we have an urgent need for them in some project - rather, we chose to add them because we got an irresistible offer. Also, should any need for them arise in the future, the price of adding them once the instrument left the factory would be a lot higher. As a result, we don't have any applications waiting to explore what they can offer.
Check out the alternative techniques!
It is clearly in everybody's interest that the techniques are explored - that we throw all kinds of samples at them and that we investigate what kind of knowledge we can extract. Ideally, all this knowledge that we acquire should be shared among all the users. We therefore strongly urge you to take a look at the techniques on the pages listed below. Here, we will collect technical information and publications so that, hopefully, you will get inspired to explore the techniques with all kinds of samples.
- XPSsimplified - The Thermofisher web page on all the Nexsa techniques
- The XPS technique
- Ion Scattering Spectroscopy or ISS
- Reflected Electron Energy Loss Spectroscopy or REELS
- Raman spectroscopy
- Ultraviolet Photoelectron Spectroscopy or UPS
Specific measurements
The Nexsa is capable of measuring a lot of
- Work function measurements
- Based on the measurements of the Fermi Level and the spectrum energy cut-off in a UPS spectrum, the work function may be measured. The Nexsa manual section 3.6.x has more information.
- Band gap measurements
- Mapping electronic bands using Angle resolved XPS (ARXPS) and UPS (ARUPS)
- The Nexsa is capable of measuring the following
Getting access to the XPS
Click HERE to see information on how to get access to the XPS.