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Specific Process Knowledge/Characterization/XPS: Difference between revisions

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DCH-Employees-701, NLAB-Employees-701, NLAB-LabmanagerAllUsers
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Jmli (talk | contribs)
DCH-Employees-701, NLAB-Employees-701, NLAB-LabmanagerAllUsers
4,569 edits
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* Work function measurements
* Work function measurements
* Ultraviolet Photoelectron Spectroscopy (UPS) with He I and He II UV source
* [[Specific Process Knowledge/Characterization/XPS/UPS technique| Ultraviolet Photoelectron Spectroscopy (UPS) with He I and He II UV source]]
* Ion Scattering Spectroscopy (ISS)
* [[Specific Process Knowledge/Characterization/XPS/ISS|Ion Scattering Spectroscopy or ISS]]
* Reflected Electron Energy Loss Spectroscopy
* [[Specific Process Knowledge/Characterization/XPS/REELS|Reflected Electron Energy Loss Spectroscopy or REELS]]
* Angular Resolved Ultraviolet Photoelectron Spectroscopy (ARUPS)
* Angular Resolved Ultraviolet Photoelectron Spectroscopy (ARUPS)
* Raman spectroscopy
* [[Specific Process Knowledge/Characterization/XPS/Raman|Raman spectroscopy]]
 
 
 
 
 
 
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!rowspan="5" style="background:silver; color:black" align="left"| Performance
!rowspan="5" style="background:silver; color:black" align="left"| Performance
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