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{| border="0" cellspacing="100" style="margin: auto;"
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| align="center" width="200px" heigth="250px" | '''Transmission Electron Microscopy (TEM)''' [[image:Microscopy-icon.png|180px|frameless |link=LabAdviser/314/Microscopy 314-307/TEM|TEM ]]
| align="center" width="200px" heigth="250px" | '''Transmission Electron Microscopy (TEM)''' [[image:Microscopy-icon.png|180px|frameless |link=LabAdviser/314/Microscopy_314-307/TEM|TEM ]]
| align="center" width="200px" | '''Scanning Electron Microscopy (SEM)''' [[image:Microscopy-icon.png|180px|frameless |link=LabAdviser/314/Microscopy 314-307/SEM|SEM ]]
| align="center" width="200px" | '''Scanning Electron Microscopy (SEM)''' [[image:Microscopy-icon.png|180px|frameless |link=LabAdviser/314/Microscopy_314-307/SEM|SEM ]]
| align="center" width="200px" | '''Dual-beam Electron Microcopes - Focused Ion Beam and Scanning Electron Microscope (FIB-SEM)''' [[image:Microscopy-icon.png|180px|frameless |link=FIB|FIB ]]
| align="center" width="200px" | '''Dual-beam Electron Microcopes - Focused Ion Beam and Scanning Electron Microscope (FIB-SEM)''' [[image:Microscopy-icon.png|180px|frameless |link=LabAdviser/314/Microscopy_314-307/FIB|FIB ]]
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