Specific Process Knowledge/Characterization/Topographic measurement: Difference between revisions
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*Confocal (depending on objective): 1nm -> 50nm | *Confocal (depending on objective): 1nm -> 50nm | ||
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* | *Accuracy 0.7% | ||
* | *Precision 0.1% | ||
|<1Å - accuracy better than 2% | |<1Å - accuracy better than 2% | ||
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