Specific Process Knowledge/Characterization/XPS/K-Alpha: Difference between revisions
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[[Image:XPS K-Alpha.jpg |frame|x300px|The position of the K-Alpha had to be rotated 90 degrees to make room for the [[Specific Process Knowledge/Characterization/XPS/Nexsa | XPS Nexsa]] in 2019.]] | [[Image:XPS K-Alpha.jpg |frame|x300px|The position of the K-Alpha had to be rotated 90 degrees to make room for the [[Specific Process Knowledge/Characterization/XPS/Nexsa | XPS Nexsa]] in 2019.]] | ||
== | ==Process information== | ||
The XPS instrument enables elemental analysis, chemical state analysis on the sample surface or deeper down by a depth profiling. A comparison about techniques and instruments used for elemental analysis at DTU Nanolab can be found on the page [[Specific Process Knowledge/Characterization/Element analysis|Element analysis]]. | The XPS instrument enables elemental analysis, chemical state analysis on the sample surface or deeper down by a depth profiling. A comparison about techniques and instruments used for elemental analysis at DTU Nanolab can be found on the page [[Specific Process Knowledge/Characterization/Element analysis|Element analysis]]. | ||