LabAdviser/Technology Research/High-resolution TEM cat-nano-surf: Difference between revisions
Created page with "=''High-resolution transmission electron microscopy of catalytic nanoparticle surfaces''= *'''Project type:''' Ph.D project *'''Project responsible:''' William Bang Lomholdt *..." |
No edit summary |
||
| Line 5: | Line 5: | ||
*'''Partners involved:''' DTU Physics | *'''Partners involved:''' DTU Physics | ||
= Project description = | |||
High resolution (HR) electron microscopy (EM) is a well-developed method to investigate sub-micrometer to sub-nanometer (especially atomic-scale) features on speci-mens to investigate. In examples for the field of energy conversion and micro- and nanoelectronics, it has become a central aspect of designing modern materials. For the field of catalysts, it is of high importance to understand structural behavior using atomic-scale (sub-Ångstrøm) microscopy, of which can be achieved with transmission elec-tron microscopy (TEM) of thin (up to 100 nm thick) samples of interests. | High resolution (HR) electron microscopy (EM) is a well-developed method to investigate sub-micrometer to sub-nanometer (especially atomic-scale) features on speci-mens to investigate. In examples for the field of energy conversion and micro- and nanoelectronics, it has become a central aspect of designing modern materials. For the field of catalysts, it is of high importance to understand structural behavior using atomic-scale (sub-Ångstrøm) microscopy, of which can be achieved with transmission elec-tron microscopy (TEM) of thin (up to 100 nm thick) samples of interests. | ||
In the presence of gases and elevated temperature, TEM can investigate catalysts in-situ to obtain the structural be-havior during the reaction, called environmental TEM (ETEM). | In the presence of gases and elevated temperature, TEM can investigate catalysts in-situ to obtain the structural be-havior during the reaction, called environmental TEM (ETEM). | ||
| Line 13: | Line 14: | ||
The investigations will be supported by scanning (T)EM and electron tomography, some of these at external facilities. | The investigations will be supported by scanning (T)EM and electron tomography, some of these at external facilities. | ||
= Publications = | |||
== First author == | |||
== Co-author == | |||
= Conference contributions = | |||
== Presentation == | |||
== Poster == | |||
= Further information = | |||
<!-- | <!-- | ||
* Description how to prepare a FIB lamella in the FEI Helios Dualbeam: [[LabAdviser/314/Preparation 314-307/Solid-matter/FIB-lamella|[CLICK]]] | * Description how to prepare a FIB lamella in the FEI Helios Dualbeam: [[LabAdviser/314/Preparation 314-307/Solid-matter/FIB-lamella|[CLICK]]] | ||
--> | --> | ||