LabAdviser/314/Microscopy 314-307/FIB/Helios: Difference between revisions
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=Equipment performance and process related parameters= | =Equipment performance and process related parameters= | ||
[[File:Helios detector.png|500px]] | [[File:Helios detector.png|500px]] | ||
= Process information = | |||
The following techniques and processes are available on the microscope (list isn't complete): | |||
Techniques: | |||
*[[LabAdviser/314/Technique/EDS|EDS/WDS]] | |||
*[[LabAdviser/314/Technique/EBSD-TKD|EBSD/TKD]] | |||
Processes: | |||
*[[LabAdviser/314/Preparation 314-307/Solid-matter/FIB-lamella|FIB lamella preparation]] | |||
'''Feedback to this page''': '''[mailto:labadviser@nanolab.dtu.dk?Subject=Feed%20back%20from%20page%20http://labadviser.nanolab.dtu.dk/index.php/LabAdviser/314/FIB/Helios click here]''' | '''Feedback to this page''': '''[mailto:labadviser@nanolab.dtu.dk?Subject=Feed%20back%20from%20page%20http://labadviser.nanolab.dtu.dk/index.php/LabAdviser/314/FIB/Helios click here]''' | ||