LabAdviser/314/Microscopy 314-307/SEM/AFEG: Difference between revisions
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* Oxford Instruments | * Oxford Instruments 50 mm<sup>2</sup> X-Max silicon drift detector, MnKα resolution at 124 eV | ||
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|style="background:LightGrey; color:black"|Operating pressures | |style="background:LightGrey; color:black"|Operating pressures | ||