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Specific Process Knowledge/Characterization/Lifetime scanner MDPmap: Difference between revisions

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length, L, can be measured also at very low injection levels with a spatial resolution limited
length, L, can be measured also at very low injection levels with a spatial resolution limited
only by the diffusion length of the charge carriers.
only by the diffusion length of the charge carriers.
'''The user manual, the APV and contact information can be found in LabManager:'''
[http://labmanager.dtu.dk/function.php?module=Machine&view=view&mach=338 Lifetime scanner MPDmap info page in LabManager],
== Performance information ==


'''Range of lifetimes''': 20 ns to several ms
'''Range of lifetimes''': 20 ns to several ms
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'''Measureable properties''': Carrier lifetime (steady state or non equilibrium (µ -PCD) selectable), photoconductivity (steady state) microwave Photoconductance Decay (µ-PCD)  
'''Measureable properties''': Carrier lifetime (steady state or non equilibrium (µ -PCD) selectable), photoconductivity (steady state) microwave Photoconductance Decay (µ-PCD)  
'''The user manual, the APV and contact information can be found in LabManager:'''
[http://labmanager.dtu.dk/function.php?module=Machine&view=view&mach=338 Lifetime scanner MPDmap info page in LabManager],
== Performance information ==
==Equipment performance and process related parameters==
==Equipment performance and process related parameters==