LabAdviser/314/Microscopy 314-307/SEM: Difference between revisions

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	= SEM =		= SEM =

	Scanning Electron Microscopy (SEM) is a technique, where a ~~focussed~~ beam of accelerated electrons is scanning over a sample. Electrons which are backscattered or secondar generated electrons are collected on a detector. Dependenging on the type of detector, different signals and sample characteristics can be acquired. The electron beam is steered by electromagnetic lenses.		Scanning Electron Microscopy (SEM) is a technique, where a focused beam of accelerated electrons is scanning over a sample. Electrons which are backscattered or secondar generated electrons are collected on a detector. Dependenging on the type of detector, different signals and sample characteristics can be acquired. The electron beam is steered by electromagnetic lenses.