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TEM

Transmission Electron Microscopy (TEM) is a technique, where accelerated electrons penetrate a thin sample and are collected on a detector. Dependenging on the type of detector, different signals and sample characteristics can be acquired. The electron beam is steered by electromagnetic lenses.

We have four TEMs available at DTU Nanolab. Click on the instrument to find more information about the equipment and available techniques:


Tecnai T12 Biotwin	Tecnai T20	Titan ATEM	Titan ETEM

Comparison between TEMs at DTU Nanolab - building 314/307

Microscope		T12	T20	ATEM	ETEM
Purpose		TEM characterization Spectroscopic charaterization	TEM characterization STEM characterization Spectroscopic charaterization	High-resolution STEM imaging Analytical microscopy Holography	High-resolution TEM imaging ETEM experiments Spectroscopic charaterization
Resolution	TEM mode	>3.5 Å	1.44 Å	1.02 Å	0.9 Å
Resolution	STEM mode	no STEM	about 10 Å	0.8 Å	1.36 Å
Spectroscopy	EDX	Oxford X-Max 80T/AZtec	Oxford X-Max 80T/AZtec	Oxford X-Max 100TLE/AZtec	Oxford X-Max 80T/AZtec
	EELS	no EELS	Gatan 863 Tridiem GIF	Gatan 865 Tridiem GIF	Gatan 866 Tridiem GIF

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 | align="center" width="200px" | '''Titan ETEM''' [[image:Microscopy-icon.png|180px|frameless |link=314/ETEM|Titan ETEM ]]
 |}
+== Comparison between TEMs at DTU Nanolab - building 314/307 ==
+{{TEM comparison table}}
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