LabAdviser/314/Microscopy 314-307/TEM: Difference between revisions
No edit summary |
No edit summary |
||
| Line 15: | Line 15: | ||
| align="center" width="200px" | '''Titan ETEM''' [[image:Microscopy-icon.png|180px|frameless |link=314/ETEM|Titan ETEM ]] | | align="center" width="200px" | '''Titan ETEM''' [[image:Microscopy-icon.png|180px|frameless |link=314/ETEM|Titan ETEM ]] | ||
|} | |} | ||
'''Feedback to this page''': '''[mailto:labadviser@nanolab.dtu.dk?Subject=Feed%20back%20from%20page%20http://labadviser.nanolab.dtu.dk/index.php/LabAdviser/314/TEM click here]''' | |||
Revision as of 09:28, 17 March 2020
THIS PAGE IS UNDER CONSTRUCTION
TEM
Transmission Electron Microscopy (TEM) is a technique, where accelerated electrons penetrate a thin sample and are collected on a detector. Dependenging on the type of detector, different signals and sample characteristics can be acquired. The electron beam is steered by electromagnetic lenses.
We have four TEMs available at DTU Nanolab. Click on the instrument to find more information about the equipment and available techniques:
Tecnai T12 Biotwin 
|
Tecnai T20
|
Titan ATEM
|
Titan ETEM
|
Feedback to this page: click here