LabAdviser/314/Microscopy 314-307/TEM: Difference between revisions
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= TEM = | |||
Transmission Electron Microscopy (TEM) is a technique, where accelerated electrons penetrate a thin sample and are collected on a detector. Dependenging on the type of detector, different signals and sample characteristics can be acquired. The electron beam is steered by electromagnetic lenses. | Transmission Electron Microscopy (TEM) is a technique, where accelerated electrons penetrate a thin sample and are collected on a detector. Dependenging on the type of detector, different signals and sample characteristics can be acquired. The electron beam is steered by electromagnetic lenses. | ||
Revision as of 09:27, 17 March 2020
THIS PAGE IS UNDER CONSTRUCTION
TEM
Transmission Electron Microscopy (TEM) is a technique, where accelerated electrons penetrate a thin sample and are collected on a detector. Dependenging on the type of detector, different signals and sample characteristics can be acquired. The electron beam is steered by electromagnetic lenses.
We have four TEMs available at DTU Nanolab. Click on the instrument to find more information about the equipment and available techniques:
Tecnai T12 Biotwin 
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Tecnai T20
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Titan ATEM
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Titan ETEM
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