Specific Process Knowledge/Lithography/Aligners/Aligner: Maskless 03 processing: Difference between revisions
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==Acceptance test== | ==Acceptance test== | ||
Acceptance criteria on a 100 X 100 mm<sup>2</sup> area: Width of smallest resolved line | Acceptance criteria on a 100 X 100 mm<sup>2</sup> area: Width of smallest resolved line 1000±100 nm (quality), alignment error 500 nm (quality), writing speed 1100 mm<sup>2</sup>/min (fast). | ||
The acceptance test also included a verification of back side alignment (better than 1 µm), as well as | The acceptance test also included a verification of back side alignment (better than 1 µm), as well as | ||