Specific Process Knowledge/Thermal Process/C1 Furnace Anneal-oxide: Difference between revisions
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*Oxidation of 100 mm and 150 mm wafers | *Oxidation of 100 mm and 150 mm wafers | ||
*Annealing of 100 mm and 150 mm wafers | *Annealing of 100 mm and 150 mm wafers | ||
|style="background:WhiteSmoke; color:black"|Oxidation: | |style="background:WhiteSmoke; color:black"| | ||
*Dry | Annealing: | ||
*Wet: | *Using N<sub>2</sub>: | ||
Oxidation: | |||
*Dry oxidation using O<sub>2</sub>: | |||
*Wet oxidation using H<sub>2</sub>: O vapour generated by a RASIRC steamer | |||
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!style="background:silver; color:black" align="center"|Performance | !style="background:silver; color:black" align="center"|Performance | ||
|style="background:LightGrey; color:black"|Film thickness | |style="background:LightGrey; color:black"|Film thickness | ||
|style="background:WhiteSmoke; color:black"| | |style="background:WhiteSmoke; color:black"| | ||
*Dry SiO<sub>2</sub>: | *Dry SiO<sub>2</sub>: ~ 0 nm to 300 nm (it takes too long to grow a thicker dry oxide layers) | ||
*Wet SiO<sub>2</sub>: | *Wet SiO<sub>2</sub>: ~ 0 nm to ~ 3 µm (23 hours wet oxidation at 1100 <sup>o</sup>C) | ||
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!style="background:silver; color:black" align="center" valign="center" rowspan="3"|Process parameter range | !style="background:silver; color:black" align="center" valign="center" rowspan="3"|Process parameter range | ||
|style="background:LightGrey; color:black"|Process Temperature | |style="background:LightGrey; color:black"|Process Temperature | ||
|style="background:WhiteSmoke; color:black"| | |style="background:WhiteSmoke; color:black"| | ||
*800- | *800-1100 <sup>o</sup>C | ||
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|style="background:LightGrey; color:black"|Process pressure | |style="background:LightGrey; color:black"|Process pressure | ||
|style="background:WhiteSmoke; color:black"| | |style="background:WhiteSmoke; color:black"| | ||
*1 atm | *1 atm (no vacuum) | ||
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|style="background:LightGrey; color:black"|Gas flows | |style="background:LightGrey; color:black"|Gas flows | ||
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|style="background:LightGrey; color:black"|Batch size | |style="background:LightGrey; color:black"|Batch size | ||
|style="background:WhiteSmoke; color:black"| | |style="background:WhiteSmoke; color:black"| | ||
*1-30 100 mm or 150 mm wafers (or 50 mm wafers) | *1-30 100 mm or 150 mm wafers (or 50 mm wafers) | ||
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| style="background:LightGrey; color:black"|Substrate materials allowed | | style="background:LightGrey; color:black"|Substrate materials allowed | ||
|style="background:WhiteSmoke; color:black"| | |style="background:WhiteSmoke; color:black"| | ||
*New silicon wafers | *New silicon wafers | ||
*Silicon wafers with layers of silicon oxide or silicon | *Silicon wafers with layers of silicon oxide or silicon nitride (RCA cleaned) | ||
*Wafers from the LPCVD furnaces | *Wafers from the LPCVD furnaces | ||
*Wafers from PECVD4 | *Wafers from PECVD4 | ||
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