Specific Process Knowledge/Characterization/Sample imaging: Difference between revisions

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	The list of instruments for sample imaging available at ~~Danchip~~ includes 6 [[Specific Process Knowledge/Characterization/Optical microscope\|optical microscopes]] , three [[Specific Process Knowledge/Characterization/SEM: Scanning Electron Microscopy\|scanning electron microscopes]] (SEM's) and an [[Specific Process Knowledge/Characterization/AFM: Atomic Force Microscopy\|atomic force microscope]] (AFM). These instruments cover a wide range of applications.		The list of instruments for sample imaging available at Nanolab includes 6 [[Specific Process Knowledge/Characterization/Optical microscope\|optical microscopes]] , three [[Specific Process Knowledge/Characterization/SEM: Scanning Electron Microscopy\|scanning electron microscopes]] (SEM's) and an [[Specific Process Knowledge/Characterization/AFM: Atomic Force Microscopy\|atomic force microscope]] (AFM). These instruments cover a wide range of applications.

	=== The optical microscopes ===		=== The optical microscopes ===