Jump to content

Specific Process Knowledge/Characterization/SEM: Scanning Electron Microscopy: Difference between revisions

Jmli (talk | contribs)
No edit summary
Jmli (talk | contribs)
Line 5: Line 5:
== Scanning electron microscopy in the cleanroom at DTU Nanolab==
== Scanning electron microscopy in the cleanroom at DTU Nanolab==


The number of electron microscopes at DTU Nanolab is large.  
The number of electron microscopes at DTU Nanolab is large. The five SEMs in building 346 cover a wide range of needs both in the cleanroom and outside: From fast in-process verification of different process parameters such as etch rates, step coverages or lift-off quality to ultra high resolution images on any type of sample intended for publication.  
At  there are five SEMs (Scanning Electron Microscopes) that all cover a wide range of needs both in the cleanroom and outside: From fast in-process verification of different process parameters such as etch rates, step coverages or lift-off quality to ultra high resolution images on any type of sample intended for publication.  


* The SEM Supra 1 is located in the basement outside the cleanroom. It is serving two purposes: Serving the users that have samples from outside the cleanroom and serving as training tool; all new SEM users with no/little SEM experience must be trained on this tool and gain basic knowledge (typically 10 hours of usage) here before being qualified for training on the SEMs in the cleanroom.
* The SEM Supra 1 is located in the basement outside the cleanroom. It is serving two purposes: Serving the users that have samples from outside the cleanroom and serving as training tool; all new SEM users with no/little SEM experience must be trained on this tool and gain basic knowledge (typically 10 hours of usage) here before being qualified for training on the SEMs in the cleanroom.
Line 19: Line 18:


The SEM Tabletop 1 is manufactured by Hitachi.
The SEM Tabletop 1 is manufactured by Hitachi.


== Common challenges in scanning electron microscopy ==
== Common challenges in scanning electron microscopy ==