Specific Process Knowledge/Lithography/Descum: Difference between revisions

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===Plasma asher 1 ===
===Plasma asher 1 ===


[[image:Descum Results aug 2019.png|right|frame| Descum results]]
[[image:Descum Results aug 2019.png|right|frame| Descum results plasma asher 1]]
[[image:descum_graf.jpg|right|frame|Descum results]]
[[image:descum_graf.jpg|right|frame|Descum results plasma asher 2]]


Descum of AZ5214E resist on 50mm silicon wafer. Wafer was placed horisontally in chamber on a 100 mm carier wafer.
Descum of AZ5214E resist on 50mm silicon wafer. Wafer was placed horisontally in chamber on a 100 mm carier wafer.

Revision as of 15:52, 19 November 2019

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Descum results

Plasma asher 1

Descum results plasma asher 1
Descum results plasma asher 2

Descum of AZ5214E resist on 50mm silicon wafer. Wafer was placed horisontally in chamber on a 100 mm carier wafer.

Note: Plasma asher was cold before use

Settings Etched Thickness (nm)
ashing time (min)
Recipe O2 flow N2 flow Power 1 2 5 7 10 10
1 70 70 150 14,2 16,3 47,6 123,2 854,3 862,1
2 500 0 200 8,1 32,9 271,1 495,6 446,2


Conny Hjort & Jesper Hanberg September 2019



Plasma asher 2

Ashing time (min) 1 2 3 4 6 7 8 9 10 12 14 15 20
Etched Thickness (nm) 8,7 5,1 12,5 6,2 31,8 86,0 25,7 46,8 38,3 49,7 59,4 140,1 360,7