Specific Process Knowledge/Lithography/Descum: Difference between revisions
Line 80: | Line 80: | ||
|- style="background:LightGrey" | |- style="background:LightGrey" | ||
| | |'''Ashing time (min)'''|| 1|| 2 || 3 || 4 || 6 || 7 || 8 || 9 || 10 || 12 || 14 || 15 || 20 | ||
|- | |- | ||
|Etched Thickness (nm)|| 8,7 || 5,1 || 12,5 || 6,2 || 31,8 || 86,0 || 25,7 || 46,8 || 38,3 || 49,7 || 59,4 || 140,1 || 360,7 | |'''Etched Thickness (nm)'''|| 8,7 || 5,1 || 12,5 || 6,2 || 31,8 || 86,0 || 25,7 || 46,8 || 38,3 || 49,7 || 59,4 || 140,1 || 360,7 | ||
|- | |- | ||
|} | |} |
Revision as of 15:01, 19 November 2019
Feedback to this page: click here
Descum results
Plasma asher 1
Descum of AZ5214E resist on 50mm silicon wafer. Wafer was placed horisontally in chamber on a 100 mm carier wafer.
Note: Plasma asher was cold before use
Plasma asher 2
|