Specific Process Knowledge/Lithography/Descum: Difference between revisions
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! colspan="13" | ashing time (min) | ! colspan="13" | ashing time (min) | ||
|- style="background:LightGrey" | |- style="background:LightGrey" | ||
|| 1|| 2 || 3 || 4 || 6 || 7 || 8 || 9 || 10 || 12 || 14 || 15 || 20 |- | || 1|| 2 || 3 || 4 || 6 || 7 || 8 || 9 || 10 || 12 || 14 || 15 || 20 | ||
| 1 || | |- | ||
| 8,7 || 5,1 || 12,5 || 6,2 || 31,8 || 86,0 || 25,7 || 46,8 || 38,3 || 49,7 || 140,1 || 360,7 | |||
|- | |- | ||
|} | |} |
Revision as of 14:50, 19 November 2019
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Descum results
Plasma asher 1
Descum of AZ5214E resist on 50mm silicon wafer. Wafer was placed horisontally in chamber on a 100 mm carier wafer.
Note: Plasma asher was cold before use
Plasma asher 2
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