Specific Process Knowledge/Lithography/Descum: Difference between revisions

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! colspan="13" | Etched Thickness (nm)  
! colspan="13" | Etched Thickness (nm)  
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! colspan="6" | ashing time (min)   
! colspan="13" | ashing time (min)   
|- style="background:LightGrey"
|- style="background:LightGrey"
|| 1|| 2 || 3 || 4 || 6 || 7 || 8 || 9 || 10 || 12 || 14 || 15 || 20 ||  
|| 1|| 2 || 3 || 4 || 6 || 7 || 8 || 9 || 10 || 12 || 14 || 15 || 20 ||  
| 1 || 2 || 5 || 7 || 10 || 10
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|-
| 1 || 70 || 70 || 150 || 14,2 || 16,3 || 47,6 || 123,2 || 854,3 || 862,1
| 1 || 70 || 70 || 150 || 14,2 || 16,3 || 47,6 || 123,2 || 854,3 || 862,1
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Revision as of 14:46, 19 November 2019

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Descum results

Plasma asher 1

Descum results

Descum of AZ5214E resist on 50mm silicon wafer. Wafer was placed horisontally in chamber on a 100 mm carier wafer.

Note: Plasma asher was cold before use

Settings Etched Thickness (nm)
ashing time (min)
Recipe O2 flow N2 flow Power 1 2 5 7 10 10
1 70 70 150 14,2 16,3 47,6 123,2 854,3 862,1
2 500 0 200 8,1 32,9 271,1 495,6 446,2


Conny Hjort & Jesper Hanberg September 2019
















Plasma asher 2

Descum results
Etched Thickness (nm)
ashing time (min)
1 2 3 4 6 7 8 9 10 12 14 15 20
1 70 70 150 14,2 16,3 47,6 123,2 854,3 862,1