Specific Process Knowledge/Thin film deposition/Temescal: Difference between revisions
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The full results of the testing can be found here: [[:File:particles-pinholes test Temescal.pptx]]. | The full results of the testing can be found here: [[:File:particles-pinholes test Temescal.pptx]]. | ||
''Testing July/August 2019 by Evgeniy Shkondin and Patama Pholprasit'' | |||
Deposition of Ti/Au revealed a big number of particles on the wafers. They amount has been heavily reduced by optimizing deposition conditions and choosing the right crucible. | |||
The particles are in fact gold droplets of various size ejected from the melt. | |||
Main guidance and conclusions: | |||
*Ensure the chamber, shutters etc. are properly cleaned. | |||
*Use as pure Au target as possible. | |||
*Do not use ceramic crucible, put Au pellets directly into the dedicated Cu heart pocket. W-crucible can be considered (but so far we did not tested it). | |||
*Sweep puttern needs to be optimized so it coveres the bigger area of the target but avoid getting the beam to close to the edges. | |||
*Optimize soak/rise powers and times. | |||
*Use deposition rate of 2Å/s. Ensure that the rise2 power is adequate for that rate. | |||
*Ensure the appropriate PID values, since the deposition rate has to be stable during the evaporation. | |||
The full results of the testing can be found here: [[:File:Au issues with Temescal.pptx]]. | |||
== Process information == | == Process information == | ||