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Specific Process Knowledge/Characterization/Four-Point Probe: Difference between revisions

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Paphol (talk | contribs)
DCH-Employees-701, NLAB-Employees-701, NLAB-LabmanagerAllUsers
912 edits
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!  
|style="background:WhiteSmoke; color:black"|'''Four point probe - Jandel'''
|style="background:WhiteSmoke; color:black"|'''Four point probe - Jandel'''
|style="background:WhiteSmoke; color:black"| '''Four point probe - Veeco'''
|style="background:WhiteSmoke; color:black"|'''Four point probe - Veeco'''
|-  
|-  
|Purpose
|Purpose
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|-
|-
|Substrate
|Substrate
|Small pieces up to 200mm wafer 
|  
|  
|


|-
 
| Rate
| About 0.7 Å/s
| About 0.6 Å/s
|-
|}
|}
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