Specific Process Knowledge/Characterization/Four-Point Probe: Difference between revisions

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	4. Low measurement result could be from electrical noise due to poor contact condition, thermally induced voltages, actinic effects, offset voltages produced by the devices in the current source etc.		4. Low measurement result could be from electrical noise due to poor contact condition, thermally induced voltages, actinic effects, offset voltages produced by the devices in the current source etc.