Specific Process Knowledge/Characterization/Four-Point Probe: Difference between revisions

Revision as of 10:19, 8 August 2019 view source Paphol (talk \| contribs) DCH-Employees-701, NLAB-Employees-701, NLAB-LabmanagerAllUsers 912 edits →Four-Point Probe ← Older edit		Revision as of 10:20, 8 August 2019 view source Paphol (talk \| contribs) DCH-Employees-701, NLAB-Employees-701, NLAB-LabmanagerAllUsers 912 edits →Four-Point Probe Newer edit →
Line 24:		Line 24:


	'''Limits of Measurement ~~Capability~~'''		'''Limits of the Measurement'''

	1. The material must be capable of being probed, i.e. the probes must be able to make ohmic contact with the material e.g. Germanium, Silicon and metals. Materials such as Gallium Arsenide cannot normally be probed unless it is doped and measured with special measuring techniques such as that in the Four Dimensions Inc. GaAs probe.		1. The material must be capable of being probed, i.e. the probes must be able to make ohmic contact with the material e.g. Germanium, Silicon and metals. Materials such as Gallium Arsenide cannot normally be probed unless it is doped and measured with special measuring techniques such as that in the Four Dimensions Inc. GaAs probe.