Specific Process Knowledge/Thermal Process/Jipelec RTP: Difference between revisions
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|style="background:LightGrey; color:black"|Process Temperature | |style="background:LightGrey; color:black"|Process Temperature | ||
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*0- | *0-1100 <sup>o</sup>C | ||
*III-V materials only to 450 <sup>o</sup>C | *III-V materials only to 450 <sup>o</sup>C | ||
*Temperature ramp up to 300 <sup>o</sup>C/min | *Temperature ramp up to 300 <sup>o</sup>C/min | ||
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*Vacuum | *Vacuum | ||
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|style="background:LightGrey; color:black"| | |style="background:LightGrey; color:black"|Gases on the system | ||
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|style="background:LightGrey; color:black"|Batch size | |style="background:LightGrey; color:black"|Batch size | ||
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*One 100 mm wafer | *One 50 mm or 100 mm wafer | ||
*Small samples (placed on a carbide carrier or a Si carrier wafer with 1 µm oxide) | *Small samples (placed on a carbide carrier or a Si carrier wafer with 1 µm oxide) | ||
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| style="background:LightGrey; color:black"|Substrate | | style="background:LightGrey; color:black"|Substrate materials allowed | ||
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A silicon carrier wafer with 1 µm oxide is | A carrier is always needed: For III-V materials a carbide carrier is used, and for other samples a silicon carrier wafer with 1 µm oxide is used | ||
*Silicon | *Silicon | ||
*Silicon | *Silicon oxide | ||
*Silicon | *Silicon nitride | ||
* | *Fused silica/quartz | ||
*Polysilicon | *Polysilicon | ||
*III-V materials (on graphite carrier, max 450 <sup>o</sup>C) | |||
*III-V materials (on graphite carrier) | *Some metals - Ask the Thin Film group for permission | ||
* | |||
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