Specific Process Knowledge/Characterization/AFM: Atomic Force Microscopy/KPFM: Difference between revisions
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KPFM (Kelvin Probe Force Microscopy) measurements can be done with this AFM Icon. It is best for mapping the surface potential on a sample with nanometer resolution but it can also be calibrated to give quantitative values. | KPFM (Kelvin Probe Force Microscopy) measurements can be done with this AFM Icon. It is best for mapping the surface potential on a sample with nanometer resolution but it can also be calibrated to give quantitative values. | ||
To get the potential/work function: set the Interleave mode to "Lift" while scanning with the KPFM workspace | |||
===Here I shortly explain how to calibrate to get work function values=== | ===Here I shortly explain how to calibrate to get work function values=== | ||