Specific Process Knowledge/Characterization/AFM: Atomic Force Microscopy/KPFM: Difference between revisions
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Work function (Tip) = Measured surface potential*e + Work function (sample) | Work function (Tip) = Measured surface potential*e + Work function (sample) | ||
When measurening on the gold to | When measurening on the gold to find the work function of the tip: | ||
Work function (Tip) = Measured surface potential*e + 5.10eV | Work function (Tip) = Measured surface potential*e + 5.10eV | ||