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Specific Process Knowledge/Characterization/Sample imaging: Difference between revisions

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DCH-Employees-701, NLAB-Employees-701, NLAB-LabmanagerAllUsers
4,565 edits
Jmli (talk | contribs)
DCH-Employees-701, NLAB-Employees-701, NLAB-LabmanagerAllUsers
4,565 edits
Line 56: Line 56:
(Sensofar)
(Sensofar)
|Scanning electron microscope  
|Scanning electron microscope  
([[Specific_Process_Knowledge/Characterization/SEM:_Scanning_Electron_Microscopy/Zeiss|SEM Supra 60VP]],  
([[Specific_Process_Knowledge/Characterization/SEM_Supra_1| SEM Supra 1]],  
[[Specific_Process_Knowledge/Characterization/SEM:_Scanning_Electron_Microscopy/Zeiss|SEM Supra 40VP]], [[Specific_Process_Knowledge/Characterization/SEM:_Scanning_Electron_Microscopy/LEO|SEM-LEO]], [[Specific_Process_Knowledge/Characterization/SEM:_Scanning_Electron_Microscopy/FEI|SEM-FEI]], [[Specific_Process_Knowledge/Characterization/SEM:_Scanning_Electron_Microscopy/Jeol|SEM-JEOL]])
[[Specific_Process_Knowledge/Characterization/SEM_Supra_2| SEM Supra 2]],  
[[Specific_Process_Knowledge/Characterization/SEM_Supra_3| SEM Supra 3]],  
[[Specific_Process_Knowledge/Characterization/SEM:_Scanning_Electron_Microscopy/LEO|SEM-LEO]], )
 
[[Specific_Process_Knowledge/Characterization/SEM_Tabletop_1| SEM Tabletop 1]],
 
|Atomic force microscope  
|Atomic force microscope  
(NanoMan)
(NanoMan)
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