Specific Process Knowledge/Etch/DryEtchProcessing/Comparison: Difference between revisions
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! style="background:silver; color:black" rowspan="2" | [[Specific Process Knowledge/Etch/III-V ICP|III-V ICP]] | ! style="background:silver; color:black" rowspan="2" | [[Specific Process Knowledge/Etch/III-V ICP|III-V ICP]] | ||
! style="background:silver; color:black" rowspan="2" | [[Specific Process Knowledge/Etch/IBE⁄IBSD Ionfab 300|IBE/IBSD Ionfab 300]] | ! style="background:silver; color:black" rowspan="2" | [[Specific Process Knowledge/Etch/IBE⁄IBSD Ionfab 300|IBE/IBSD Ionfab 300]] | ||
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! style="background:silver; color:black"| [[Specific_Process_Knowledge/Etch/DRIE-Pegasus/Pegasus-1|Pegasus 1]] | ! style="background:silver; color:black"| [[Specific_Process_Knowledge/Etch/DRIE-Pegasus/Pegasus-1|Pegasus 1]] |
Revision as of 11:04, 12 November 2018
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Hardware and option comparison of the dry etchers at Danchip
The table below compares the hardware and the options.
ASE | AOE | DRIE-Pegasi | ICP Metal etch | III-V RIE | III-V ICP | IBE/IBSD Ionfab 300 | ||||||||||||||||||||||||||||||||||||||||||||||
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Pegasus 1 | Pegasus 2 | |||||||||||||||||||||||||||||||||||||||||||||||||||
Purpose | Primary uses | Formerly the primary silicon etcher; now polymers, Silicon oxides and nitrides may also be etched. 5% metal on the surface is allowed. | Etching of silicon oxides or nitrides | Silicon etching | Standard recipes for etching of Al, Cr and Ti, now also etches of W, TiW and Mo | Etching of silicon oxide, resist, BCB, silicon nitride, InP, InGaAs and GaAs on III-V substrates | Etching of III-V materials such as GaN, InP/InGaAsP/InGaAs, AlGaAs, GaAs | Physical Etching of all materials | ||||||||||||||||||||||||||||||||||||||||||||
Alternative/backup uses | Backup silicon etcher | Barc etch | Silicon etcher | |||||||||||||||||||||||||||||||||||||||||||||||||
General description | Plasma source | Inductively coupled plasma chamber with two RF generators; the coil and platen generator | Inductively coupled plasma chamber with two RF generators; the coil and platen generator | Inductively coupled plasma chamber with two RF generators; the coil (with outer and inner coil) and platen generator | Inductively coupled plasma chamber with two RF generators; the coil and platen generator | Parallel plate capacitor setup with RF power between the two electrodes | Inductively coupled plasma chamber with two RF generators; the coil and platen generator | Ion beam etcher - sputter etches with argon ions | ||||||||||||||||||||||||||||||||||||||||||||
Substrate cooling/temperature | The electrode is oil cooled. Also, Helium backside cooling: -10oC to 20oC | The electrode is oil cooled. Also, Helium backside cooling: -10oC to 60oC | The electrode is oil cooled. Also, Helium backside cooling: -20oC to 30oC | The electrode is oil cooled. Also, Helium backside cooling: -10oC to 50oC | The electrode is oil cooled: Fixed at 20oC | The electrode is oil cooled with a special chiller. Also, Helium backside cooling: 20oC to 180oC | The electrode is oil cooled with a special chiller. Also, Helium backside cooling: 5oC to 60?oC | |||||||||||||||||||||||||||||||||||||||||||||
Clamping | Electrostatic clamping (semco electrode) | Electrostatic clamping (TDESC) | Electrostatic clamping (TDESC) | Electrostatic clamping (TDESC) | No clamping | Mechanical clamping (weighted clamp with ceramic fingers) | Mechanical clamping | |||||||||||||||||||||||||||||||||||||||||||||
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RF generators |
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Substrate loading | Loading via dedicated two-slot carousel load lock | Loading via dedicated two-slot carousel load lock | Loading via dedicated two-slot carousel load lock or via atmospheric cassette loader | Loading via dedicated two-slot carousel load lock | Loading via dedicated two-slot carousel load lock | Manual loading directly into process chamber | Loading via dedicated two-slot carousel load lock | Automatic loading via load lock | ||||||||||||||||||||||||||||||||||||||||||||
Options |
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Allowed materials |
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