Specific Process Knowledge/Characterization: Difference between revisions
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*[[/Thickness Measurer|Thickness Measurer]] | *[[/Thickness Measurer|Thickness Measurer]] | ||
*[[/DSC Perkin Elmer|DSC Perkin Elmer]] | *[[/DSC Perkin Elmer|DSC Perkin Elmer - Differential Scanning Calorimetry]] | ||
*[[/Probe station|Probe station]] | *[[/Probe station|Probe station]] | ||
*[[/Hardness measurement|Hardness tester]] | *[[/Hardness measurement|Hardness tester]] | ||
Revision as of 12:19, 23 October 2018
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Overview of characteristics and where to measure it
| Optical Micro- scopes | SEM (incl. EDX) | AFM | Stylus profiler | Optical profiler | Filmtek (reflec- tometer) | Ellip- someter | Thickness stylus | XPS | PL mapper | 4-point probe | Probe station | XRD | Life time scanner | Drop shape analyser | Hardness tester | Differential Scanning Calorimeter DSC | Surfscan | |
| Thin film thickness | x 1) | x 1) | x 2) | x 2) | x | x | x | x 5) | x 3) | x | ||||||||
| Defects | x | x | ||||||||||||||||
| Wafer thickness | x 1) | x 1) | x | |||||||||||||||
| Step coverage | x 1) | x 1) | ||||||||||||||||
| Particles | x | x | x | x | ||||||||||||||
| Element analysis | x | x | x 4) | x 4) | ||||||||||||||
| Surface roughness | x | x | x | |||||||||||||||
| Deposition uniformity | x | x | x | |||||||||||||||
| Film stress | x | x | ||||||||||||||||
| Refractive index | x | x | ||||||||||||||||
| Reflectivity | x | x | x 6) | |||||||||||||||
| Resistivity | x | |||||||||||||||||
| Breakdown voltage | ||||||||||||||||||
| Electrical conductivity | x | |||||||||||||||||
| Thermal conductivity | ||||||||||||||||||
| Optical gap | x | x | ||||||||||||||||
| Crystalinity | x | x | ||||||||||||||||
| Charge carrier life time | x | |||||||||||||||||
| Contact angle hydrophobic/hydrophillic | x | |||||||||||||||||
| Material Hardness | x | |||||||||||||||||
| Voids in wafer bonding | x | |||||||||||||||||
| Phase changes | x | |||||||||||||||||
- Using the cross section method
- Using the create step method
- With known resistivity
- Composition information for crystalline materials
- Only single layer
- Good for characterization of VCSEL structures and DBR mirrors
Choose characterization topic
- Element analysis
- Measurement of film thickness and optical constants
- Photoluminescence mapping
- Sample imaging
- Sample preparation for inspection
- Stress measurement
- Hardness measurement
- Wafer thickness measurement
- Topographic measurement
- Contact angle measurement
- Four-Point Probe (Resistivity measurement)
- Carrier density (doping) profiler
- Scanning Electron Microscopy
Choose equipment
AFM
Element analysis
Optical and stylus profilers
Optical microscopes
Optical characterization
- Ellipsometer
- Filmtek 4000
- Prism Coupler
- PL mapper - Photoluminescence mapper
- Lifetime scanner MDPmap
SEMs at CEN
- FIB-SEM FEI QUANTA 200 3D
- Dual Beam FEI Helios Nanolab 600
- SEM FEI Nova 600 NanoSEM
- SEM FEI Quanta 200 ESEM FEG
- SEM Inspect S