Specific Process Knowledge/Thin film deposition/Temescal: Difference between revisions
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*[[/Acceptance Test|Acceptance Test]] | *[[/Acceptance Test|Acceptance Test]] | ||
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====Materials for e-beam evaporation==== | ====Materials for e-beam evaporation==== | ||
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The machine gives a rough number for the crystal lifetime simply based on how thick a layer it calculates has been deposited on it. If many layers have been deposited and there is stress in the layers (e.g., in Cr, Ni, or Ru layers), there may be partial delamination, which can make the thickness measurement inaccurate. In this case the lifetime estimate given by the machine will be inaccurate. If you think the crystal is not measuring correctly, please let us know. We exchange the crystals usually around 20 % lifetime use. | The machine gives a rough number for the crystal lifetime simply based on how thick a layer it calculates has been deposited on it. If many layers have been deposited and there is stress in the layers (e.g., in Cr, Ni, or Ru layers), there may be partial delamination, which can make the thickness measurement inaccurate. In this case the lifetime estimate given by the machine will be inaccurate. If you think the crystal is not measuring correctly, please let us know. We exchange the crystals usually around 20 % lifetime use. | ||
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== Section to follow == | == Section to follow == | ||
*About heating during deposition | *About heating during deposition | ||