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| ![[Specific Process Knowledge/Etch/KOH Etch|Si Etch]] | | ![[Specific Process Knowledge/Etch/KOH Etch|Si Etch]] |
| ![[Specific Process Knowledge/Etch/Wet Polysilicon Etch|Wet PolySilicon etch]] | | ![[Specific Process Knowledge/Etch/Wet Polysilicon Etch|Wet PolySilicon etch]] |
| ![[Specific Process Knowledge/Etch/RIE (Reactive Ion Etch)|RIE (Reactive Ion Etch)]]
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| ![[Specific Process Knowledge/Etch/DRIE-Pegasus|DRIE-Pegasus (Deep Reactive Ion Etch)]] | | ![[Specific Process Knowledge/Etch/DRIE-Pegasus|DRIE-Pegasus (Deep Reactive Ion Etch)]] |
| ![[Specific Process Knowledge/Etch/ASE (Advanced Silicon Etch)|ASE (Advanced Silicon Etch)]] | | ![[Specific Process Knowledge/Etch/ASE (Advanced Silicon Etch)|ASE (Advanced Silicon Etch)]] |
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| *Isotropic etch in crystalline silicon and polysilicon | | *Isotropic etch in crystalline silicon and polysilicon |
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| *Can etch isotropic and anisotropic depending on the process parameters and mask design.
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| *State-of-the-art dry silicon etcher with atmospheric cassette loader | | *State-of-the-art dry silicon etcher with atmospheric cassette loader |
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| *Extremely high etch rate and advanced processing options | | *Extremely high etch rate and advanced processing options |
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| *As RIE but better for high aspect ratio etching and deep etches (higher etch rate) | | *Can etch isotropic and anisotropic depending on the process parameters and mask design |
| *Good selectivity to photoresist | | *Good selectivity to photoresist |
| *The ASE is dedicated to polymer etch, which can affect the Si etch stability. | | *The ASE open for same metal on the samples and SiO2 etching, which can affect the Si etch stability. |
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| *This is dedicated to metal etch. So fare only Si etch of nanostructures has been explored on the system. | | *This is dedicated to metal etch. So fare only Si etch of nanostructures has been explored on the system. |
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| *Silicon Nitride | | *Silicon Nitride |
| *Silicon Oxide | | *Silicon Oxide |
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| *Silicon Nitride
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| *Silicon Oxide
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| *Photoresist
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| *Photo-, DUV- and e-beamresist | | *Photo-, DUV- and e-beamresist |
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| *~100-200 nm/min, highly dependent on doping level | | *~100-200 nm/min, highly dependent on doping level |
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| *<40nm/min to >600nm/min depending on recipe parameters and mask design
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| *Up to 18-20 µm/min depending on recipe, mask design and aspect ratio. | | *Up to 18-20 µm/min depending on recipe, mask design and aspect ratio. |
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| *<nowiki>#</nowiki>1 100 mm wafer | | *<nowiki>#</nowiki>1 100 mm wafer |
| *<nowiki>#</nowiki>1 150 mm wafers (only when the system is set up to 150mm) | | *<nowiki>#</nowiki>1 150 mm wafers (only when the system is set up to 150mm) |
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| *As many small samples as can be fitted on a 100mm wafer
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| *<nowiki>#</nowiki>1 50 mm wafer fitted on a 100mm wafer
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| *<nowiki>#</nowiki>1 100 mm wafer
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| *<nowiki>#</nowiki>1 150 mm wafers (only RIE2 when set up for 150mm)
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| *As many small samples as can be fitted on a 150mm wafer | | *As many small samples as can be fitted on a 150mm wafer |
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| *Silicon Oxynitride | | *Silicon Oxynitride |
| *Photoresist | | *Photoresist |
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| *Silicon
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| *Silicon Oxide
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| *Silicon Nitride
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| *Silicon Oxynitride
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| *Photo-, DUV- and e-beamresist
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| *Other metals if they cover less than 5% of the wafer area (ONLY RIE2!)
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| *Quartz/fused silica
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| *Silicon | | *Silicon |
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| *Aluminium | | *Aluminium |
| *Quartz/fused silica | | *Quartz/fused silica |
| | *Other metals if they cover less than 5% of the wafer area |
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| *Silicon | | *Silicon |
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Comparing silicon etch methods at Danchip
There are a broad varity of silicon etch methodes at Danchip. The methodes are compared here to make it easier for you to compare and choose the one that suits your needs.
Wet etches:
Dry etches:
Compare the methods for Si etching
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Si Etch
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Wet PolySilicon etch
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DRIE-Pegasus (Deep Reactive Ion Etch)
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ASE (Advanced Silicon Etch)
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ICP Metal Etch
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IBE/IBSD Ionfab 300
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Generel description
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- Anisotropic etch in crystalline silicon
- High selectivity to the {111}-planes
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- Isotropic etch in crystalline silicon and polysilicon
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- State-of-the-art dry silicon etcher with atmospheric cassette loader
- Good selectivity to photoresist
- Extremely high etch rate and advanced processing options
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- Can etch isotropic and anisotropic depending on the process parameters and mask design
- Good selectivity to photoresist
- The ASE open for same metal on the samples and SiO2 etching, which can affect the Si etch stability.
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- This is dedicated to metal etch. So fare only Si etch of nanostructures has been explored on the system.
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- Primarily for pure physical etch by sputtering with Ar-ions
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Possible masking materials
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- Silicon Nitride
- Silicon Oxide
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- Photo-, DUV- and e-beamresist
- E-beam resist
- Silicon Oxide
- Silicon Nitride
- Aluminium
- Chromium (ONLY RIE2!)
- Other metals if they cover less than 5% of the wafer area (ONLY RIE2!)
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- Photo-, DUV- and e-beamresist
- Silicon Oxide
- Silicon Nitride
- Aluminium oxide
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- Photo-, DUV- and e-beamresist
- Silicon Oxide
- Silicon Nitride
- Aluminium
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- Photo-, DUV- and e-beamresist
- Silicon Oxide
- Silicon Nitride
- Aluminium
- Cr
- Ti
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- Any material that is accepted in the machine
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Etch rate range
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- Si(100) @80oC: 1.29+0.05 µm/min
- Si(100) @70oC: ~0.7 µm/min
- Si(100) @60oC: ~0.4 µm/min
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- ~100-200 nm/min, highly dependent on doping level
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- Up to 18-20 µm/min depending on recipe, mask design and aspect ratio.
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- <130nm/min to >5.6 µm/min depending on recipe, mask design and aspect ratio.
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- Process dependent. The nano etch is in the range 59-311 nm/min
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- Process dependent. Has been tested in the range 17-31 nm/min
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Substrate size
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- #25 wafers of 100mm or 150nm in Si Etch 1 & 2
- #25 wafers of 100mm or 150nm and smaller samples in Si Etch 3 (fume hood)
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- ##25 wafers of 100mm or 150nm mm wafers
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- As many small samples as can be fitted on the 100mm carrier.
- #1 100mm wafer (or smaller with carrier)
- #1 150mm wafer (only when the system is set up for 150mm)
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- As many small samples as can be fitted on a 100mm wafer
- #1 50 mm wafer fitted on a 100mm wafer
- #1 100 mm wafer
- #1 150 mm wafers (only when the system is set up to 150mm)
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- As many small samples as can be fitted on a 150mm wafer
- #5 50 mm wafers fitted on a 150mm wafer
- #1 100 mm wafer on a 150mm wafer
- #1 150 mm wafers (The system is normally set up to 150mm)
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- As many samples as can be securely fitted on a up to 200mm wafer
- #1 50 mm wafer with special carrier
- #1 100 mm wafer with special carrier
- #1 150 mm wafers with special carrier
- #1 200 mm wafer
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Allowed materials
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- Silicon
- Silicon Oxide
- Silicon Nitride
- Silicon Oxynitride
- Other materials (only in "Si Etch 3 (fume hood))
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- Silicon
- Silicon Oxide
- Silicon Nitride
- Silicon Oxynitride
- Photoresist
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- Silicon
- Silicon Oxide
- Silicon Nitride
- Silicon Oxynitride
- Photo-, DUV- and e-beamresist
- Aluminium oxide
- Quartz/fused silica
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- Silicon
- Silicon Oxide
- Silicon Nitride
- Silicon Oxynitride
- Photo-, DUV- and e-beamresist
- Aluminium
- Quartz/fused silica
- Other metals if they cover less than 5% of the wafer area
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- Silicon
- Photo-, DUV- and e-beamresist
- PolySilicon
- Silicon oxide
- Silicon (oxy)nitride
- Aluminium
- Titanium
- Chromium
- Quartz/fused silica
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- Silicon
- Silicon oxides
- Silicon (oxy)nitrides
- Metals from the +list
- Metals from the -list
- Alloys from the above list
- Stainless steel
- Glass
- III-V materials
- Resists
- Polymers
- Capton tape
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