Jump to content

Specific Process Knowledge/Characterization/AFM: Atomic Force Microscopy/KPFM: Difference between revisions

Bghe (talk | contribs)
Bghe (talk | contribs)
Line 34: Line 34:
The value can be typed into the workspace and after that the potential window will show you the work function.  
The value can be typed into the workspace and after that the potential window will show you the work function.  


The accuracy of your results are limited by the accuracy of the value you use for calibration. It is also limited by the state of the tip. If the tip radius change after the calibration this will affect your results and the tip should be calibrated again. Other things to consider is that the sample surface must be grounded to the stage. Here you can use Al-tape from the surface of the your sample (be very careful not to hit the tape with the AFM probe.
'''The accuracy of your results are limited by'''
*the accuracy of the value you use for calibration.  
*It is also limited by the state of the tip. If the tip radius change after the calibration this will affect your results and the tip should be calibrated again.  
*Other things to consider is that the sample surface must be grounded to the stage. Here you can use Al-tape from the surface of the your sample (be very careful not to hit the tape with the AFM probe.