Specific Process Knowledge/Characterization/Probe station: Difference between revisions
| Line 4: | Line 4: | ||
==Thickness measurer== | ==Thickness measurer== | ||
[[Image: | [[Image:probe2.jpg|thumb|300x300px|Thickness Measurer. Positioned in serviceroom CX1]] | ||
The purpose is to measure the thickness of wafers, depths of larger grooves or height of larger mesas. | The purpose is to measure the thickness of wafers, depths of larger grooves or height of larger mesas. | ||